This study compares the effects of high pressure on the bulk modulus and pressure derivatives of a few nanomaterials, including Ge(13 nm), TiO₂, Ni(20 nm), CuO, and Si(4.1 nm), which have better uses in contemporary technology. The pressure dependence of bulk modulus was assessed using the EOS of Vinet and Birch-Murnaghan. It was found that the high-pressure effect is highly dependent on the considered particle size.  The current study aims to theoretically predict the bulk modulus of nanomaterials of varying sizes in relation to pressure at a standard temperature. The bulk modulus and pressure derivative of the bulk modulus's trend of change against volume compressions, as we have discovered.